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Measurements of the Absolute Values of the Radiation Intensity in the Wavelength Range of 6.6–32 nm of Stainless Steel Targets with Pulsed Laser Excitation.
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- Technical Physics, 2024, v. 69, n. 4, p. 870, doi. 10.1134/S1063784224030125
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Search for High-Strength Multilayer Free-Standing Film Filters with High Transmittance in the Wavelength Range of the "Water Window" (2.3–4.4 nm).
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- Technical Physics, 2024, v. 69, n. 4, p. 785, doi. 10.1134/S1063784224030010
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- Article
Imaging System of a Plasma Torch of a Betatron X-Ray Source.
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- Technical Physics, 2024, v. 69, n. 3, p. 480, doi. 10.1134/S1063784224020051
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- Article
The diamond–silicon carbide composite Skeleton<sup>®</sup> as a promising material for substrates of intense X‐ray beam optics.
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- Journal of Synchrotron Radiation, 2024, v. 31, n. 5, p. 1179, doi. 10.1107/S1600577524006088
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- Article
Thin Film Al Targets for a Laser-Plasma Source of Extreme Ultraviolet Radiation.
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- Technical Physics, 2024, v. 69, n. 2, p. 229, doi. 10.1134/S1063784224010134
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- Article
Electron Energy Conversion to EUV Radiation in the K<sub>α</sub> Line of Be in the "Shooting Through" Geometry.
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- Journal of Experimental & Theoretical Physics, 2018, v. 127, n. 6, p. 985, doi. 10.1134/S1063776118100175
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- Article
Soft X-rays Generated by the Electron-Cyclotron Resonance Discharge in Heavy Gases Sustained by a High-Power Microwave Beam in a Magnetic Trap.
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- Technical Physics Letters, 2000, v. 26, n. 12, p. 1075, doi. 10.1134/1.1337258
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- Article
Comparative Study of the Thermal Stability of Be-Based Extreme Ultraviolet Pellicles.
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- Technical Physics, 2023, v. 68, p. S630, doi. 10.1134/S106378422390098X
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- Article
Prospects for the Use of X-Ray Tubes with a Field-Emission Cathode and a Through-Type Anode in the Range of Soft X-Ray Radiation.
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- Technical Physics, 2020, v. 65, n. 11, p. 1726, doi. 10.1134/S1063784220110043
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- Article
Optical, Mechanical, and Thermal Properties of Free-Standing MoSi<sub>2</sub>N<sub>x</sub> and ZrSi<sub>2</sub>N<sub>y</sub> Nanocomposite Films.
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- Technical Physics, 2019, v. 64, n. 11, p. 1590, doi. 10.1134/S1063784219110306
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- Article
New focusing multilayer structures for X-ray and VUV plasma spectroscopy.
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- Technical Physics, 2010, v. 55, n. 7, p. 1018, doi. 10.1134/S1063784210070169
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- Article
On the Formation of an Anti-Reflection Layer on the Surface of Single-Crystal Silicon by Ion-Beam Etching.
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- Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2023, v. 17, p. S259, doi. 10.1134/S1027451023070583
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- Article
Measurements of the Thermophysical Characteristics of Thin-Film Metal Filters for Extreme-Ultraviolet Radiation.
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- Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2023, v. 17, n. 6, p. 1323, doi. 10.1134/S1027451023060344
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- Article