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Wafer Scale Mapping and Statistical Analysis of Radio Frequency Characteristics in Highly Uniform CVD Graphene Transistors.
- Published in:
- Advanced Electronic Materials, 2019, v. 5, n. 4, p. N.PAG, doi. 10.1002/aelm.201800711
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- Article
Black Phosphorus Radio Frequency Electronics at Cryogenic Temperatures.
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- Advanced Electronic Materials, 2018, v. 4, n. 8, p. 1, doi. 10.1002/aelm.201800138
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- Article
Highly Anisotropic Sb<sub>2</sub>Se<sub>3</sub> Nanosheets: Gentle Exfoliation from the Bulk Precursors Possessing 1D Crystal Structure.
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- Advanced Materials, 2017, v. 29, n. 29, p. n/a, doi. 10.1002/adma.201700441
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- Article
9‐2: Compact Model for Thin‐Film Transistors with Capacitance Frequency Dispersion.
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- SID Symposium Digest of Technical Papers, 2024, v. 55, n. 1, p. 84, doi. 10.1002/sdtp.17003
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- Article