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Use of the Anisotropic Magnetoresistance Effect for Direct Measurement of the Coercivity and Exchange Bias Fields of Magnetization Reversal in Conducting Magnetic Films of Nanometer Thickness.
- Published in:
- Technical Physics Letters, 2005, v. 31, n. 10, p. 875, doi. 10.1134/1.2121844
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- Article
Photovoltaic X-ray Detectors Based on Epitaxial GaAs Structures.
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- Technical Physics Letters, 2002, v. 28, n. 1, p. 15, doi. 10.1134/1.1448629
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- Article
Thin-Film Magnetically Soft Fe–Zr–N Alloys with High Saturation Induction.
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- Technical Physics Letters, 2001, v. 27, n. 3, p. 176, doi. 10.1134/1.1359817
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- Article
Combined Technology Fabrication of Spin-Valve Magnetoresistive Elements and Micromagnets.
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- Technical Physics, 2018, v. 63, n. 6, p. 848, doi. 10.1134/S1063784218060038
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- Article
Direct Laser Writing of A Channel Waveguide in Al<sub>2</sub>O<sub>3</sub>:Nd Thin Film.
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- Journal of Laser Micro / Nanoengineering, 2015, v. 10, n. 2, p. 124, doi. 10.2961/jlmn.2015.02.0003
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- Article