Found: 15
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Hard X‐ray wavefront correction via refractive phase plates made by additive and subtractive fabrication techniques.
- Published in:
- Journal of Synchrotron Radiation, 2020, v. 27, n. 5, p. 1121, doi. 10.1107/S1600577520007900
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- Article
Measurement and compensation of misalignment in double‐sided hard X‐ray Fresnel zone plates.
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- Journal of Synchrotron Radiation, 2020, v. 27, n. 3, p. 583, doi. 10.1107/S1600577520001757
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- Article
Wavefront sensing at X‐ray free‐electron lasers.
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- Journal of Synchrotron Radiation, 2019, v. 26, n. 4, p. 1115, doi. 10.1107/S1600577519005721
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- Article
Experimental Realisation of High-sensitivity Laboratory X-ray Grating-based Phase-contrast Computed Tomography.
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- Scientific Reports, 2016, p. 24022, doi. 10.1038/srep24022
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- Article
7 nm Spatial Resolution in Soft X-ray Microscopy.
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- 2018
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- Abstract
Diffractive X-ray Optics for Synchrotrons and Free-Electron Lasers.
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- 2018
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- Abstract
Toward Hard X-ray Transmission Microscopy at the ANATOMIX Beamline of Synchrotron SOLEIL.
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- 2018
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- Abstract
Scanning Hard X-Ray Microscopy Based on Be CRLs.
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- 2018
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- Abstract
7 nm Spatial Resolution in Soft X-ray Microscopy.
- Published in:
- 2018
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- Publication type:
- Abstract
Diffractive X-ray Optics for Synchrotrons and Free-Electron Lasers.
- Published in:
- 2018
- By:
- Publication type:
- Abstract
Toward Hard X-ray Transmission Microscopy at the ANATOMIX Beamline of Synchrotron SOLEIL.
- Published in:
- 2018
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- Publication type:
- Abstract
Scanning Hard X-Ray Microscopy Based on Be CRLs.
- Published in:
- 2018
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- Abstract
Multi-beam X-ray ptychography using coded probes for rapid non-destructive high resolution imaging of extended samples.
- Published in:
- Scientific Reports, 2022, v. 12, n. 1, p. 1, doi. 10.1038/s41598-022-09466-5
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- Article
CRL optics and silicon drift detector for P06 Microprobe experiments at 35 keV — ERRATUM.
- Published in:
- 2021
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- Correction Notice
CRL optics and silicon drift detector for P06 Microprobe experiments at 35 keV.
- Published in:
- Powder Diffraction, 2020, v. 35, n. S1, p. S34, doi. 10.1017/S0885715620000536
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- Article