Found: 2
Select item for more details and to access through your institution.
Si<sup>−</sup> useful yields measured in Si, SiC, Si<sub>3</sub> N<sub>4</sub> and SiO<sub>2</sub>: comparison between the Storing Matter technique and SIMS.
- Published in:
- Surface & Interface Analysis: SIA, 2014, v. 46, p. 39, doi. 10.1002/sia.5607
- By:
- Publication type:
- Article
Investigation of the depth-profiling capabilities of the Storing Matter technique.
- Published in:
- Journal of Mass Spectrometry, 2015, v. 50, n. 10, p. 1144, doi. 10.1002/jms.3632
- By:
- Publication type:
- Article