Mitigation of Single-Event Effects in SiGe-HBT Current-Mode Logic Circuits.

Published in:

Sensors (14248220), 2020, v. 20, n. 9, p. 2581, doi. 10.3390/s20092581

By:

• Sarker, Md Arifur R.;
• Jung, Seungwoo;
• Ildefonso, Adrian;
• Khachatrian, Ani;
• Buchner, Stephen P.;
• McMorrow, Dale;
• Paki, Pauline;
• Cressler, John D.;
• Song, Ickhyun

Publication type:

Article