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Optimization of optoelectronic performance of ITO/AG/ITO electrodes by using taguchi method and spectroscopic ellipsometry technique.
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- Modern Physics Letters B, 2022, v. 36, n. 16, p. 1, doi. 10.1142/S021798492242009X
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- Article
The development of a monitoring system for analyzing factors affecting film thickness in a sputtering process.
- Published in:
- Modern Physics Letters B, 2020, v. 34, n. 7-9, p. N.PAG, doi. 10.1142/S0217984920400217
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- Article