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  • Synchrotron CT imaging of lattice structures with engineered defects.

    Published in:
    Journal of Materials Science, 2020, v. 55, n. 25, p. 11353, doi. 10.1007/s10853-020-04840-y
    By:
    • Patterson, Brian M.;
    • Kuettner, Lindsey;
    • Shear, Trevor;
    • Henderson, Kevin;
    • Herman, Matthew J.;
    • Ionita, Axinte;
    • Chawla, Nikhilesh;
    • Williams, Jason;
    • Sun, Tao;
    • Fezzaa, Kamel;
    • Xiao, Xianghui;
    • Welch, Cynthia
    Publication type:
    Article