Synchrotron CT imaging of lattice structures with engineered defects.Published in:Journal of Materials Science, 2020, v. 55, n. 25, p. 11353, doi. 10.1007/s10853-020-04840-yBy:Patterson, Brian M.;Kuettner, Lindsey;Shear, Trevor;Henderson, Kevin;Herman, Matthew J.;Ionita, Axinte;Chawla, Nikhilesh;Williams, Jason;Sun, Tao;Fezzaa, Kamel;Xiao, Xianghui;Welch, CynthiaPublication type:Article