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Direct identification of interfacial degradation in blue OLEDs using nanoscale chemical depth profiling.
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- Nature Communications, 2023, v. 14, n. 1, p. 1, doi. 10.1038/s41467-023-43840-9
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Featured Cover.
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- Surface & Interface Analysis: SIA, 2022, v. 54, n. 4, p. i, doi. 10.1002/sia.7084
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OrbiSIMS metrology Part I: Optimisation of the target potential and collision cell pressure.
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- Surface & Interface Analysis: SIA, 2022, v. 54, n. 4, p. 331, doi. 10.1002/sia.7058
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- Article
A two‐point calibration method for quantifying organic binary mixtures using secondary ion mass spectrometry in the presence of matrix effects.
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- Surface & Interface Analysis: SIA, 2022, v. 54, n. 4, p. 363, doi. 10.1002/sia.7042
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- Article
Argon cluster cleaning of Ga<sup>+</sup> FIB‐milled sections of organic and hybrid materials.
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- Surface & Interface Analysis: SIA, 2020, v. 52, n. 6, p. 327, doi. 10.1002/sia.6522
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- Article
SIMS of organic layers with unknown matrix parameters: Locating the interface in dual beam argon gas cluster depth profiles.
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- Surface & Interface Analysis: SIA, 2019, v. 51, n. 13, p. 1332, doi. 10.1002/sia.6701
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- Article
Summary of ISO/TC 201 Standard: ISO 22415—Surface chemical analysis—Secondary ion mass spectrometry—Method for determining yield volume in argon cluster sputter depth profiling of organic materials.
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- Surface & Interface Analysis: SIA, 2019, v. 51, n. 10, p. 1018, doi. 10.1002/sia.6686
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