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The origin of Mooij correlations in disordered metals.
- Published in:
- NPJ Quantum Materials, 2018, v. 3, n. 1, p. N.PAG, doi. 10.1038/s41535-018-0119-y
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- Article
Preface to special issue on Knowledge Engineering for Planning and Scheduling.
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- Knowledge Engineering Review, 2013, v. 28, n. 2, p. 117, doi. 10.1017/S0269888912000379
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- Article
Validation and verification issues in a timeline-based planning system.
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- Knowledge Engineering Review, 2010, v. 25, n. 3, p. 299, doi. 10.1017/S0269888910000160
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- Article
Negative Isotope Effect on Field‐Effect Hole Transport in Fully Substituted <sup>13</sup>C‐Rubrene.
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- Advanced Electronic Materials, 2017, v. 3, n. 4, p. 1, doi. 10.1002/aelm.201700018
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- Article
Rise and fall of Landau's quasiparticles while approaching the Mott transition.
- Published in:
- Nature Communications, 2021, v. 12, n. 1, p. 1, doi. 10.1038/s41467-021-21741-z
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- Article
Tailoring the Molecular Structure to Suppress Extrinsic Disorder in Organic Transistors.
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- Advanced Materials, 2014, v. 26, n. 8, p. 1254, doi. 10.1002/adma.201304130
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- Article
Avoiding Stripe Order: Emergence of the Supercooled Electron Liquid.
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- Journal of Superconductivity & Novel Magnetism, 2016, v. 29, n. 3, p. 601, doi. 10.1007/s10948-015-3310-4
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- Article
The Transient Localization Scenario for Charge Transport in Crystalline Organic Materials.
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- Advanced Functional Materials, 2016, v. 26, n. 14, p. 2292, doi. 10.1002/adfm.201502386
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- Article
High‐Efficiency Ion‐Exchange Doping of Conducting Polymers.
- Published in:
- Advanced Materials, 2022, v. 34, n. 22, p. 1, doi. 10.1002/adma.202102988
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- Article
Doping‐Induced Dielectric Catastrophe Prompts Free‐Carrier Release in Organic Semiconductors.
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- Advanced Materials, 2022, v. 34, n. 2, p. 1, doi. 10.1002/adma.202105376
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- Article
Chasing the "Killer" Phonon Mode for the Rational Design of Low‐Disorder, High‐Mobility Molecular Semiconductors.
- Published in:
- Advanced Materials, 2019, v. 31, n. 43, p. N.PAG, doi. 10.1002/adma.201902407
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- Article
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- Published in:
- Computational Intelligence, 2011, v. 27, n. 1, p. 83, doi. 10.1111/j.1467-8640.2010.00373.x
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- Publication type:
- Article