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Remotely operated optical lab equipment for education: a DIY approach.
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- Optical Engineering, 2024, v. 63, n. 7, p. 71414, doi. 10.1117/1.OE.63.7.071414
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Correlation between two‐ and three‐dimensional crystallographic lattices for epitaxial analysis. I. Theory.
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- Acta Crystallographica. Section A, Foundations & Advances, 2022, v. 78, n. 3, p. 262, doi. 10.1107/S2053273322002182
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Correlation between two‐ and three‐dimensional crystallographic lattices for epitaxial analysis. II. Experimental results.
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- Acta Crystallographica. Section A, Foundations & Advances, 2022, v. 78, n. 3, p. 272, doi. 10.1107/S2053273322002170
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An efficient method for indexing grazing‐incidence X‐ray diffraction data of epitaxially grown thin films.
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- Acta Crystallographica. Section A, Foundations & Advances, 2020, v. 76, n. 3, p. 345, doi. 10.1107/S2053273320001266
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GIDVis: a comprehensive software tool for geometry‐independent grazing‐incidence X‐ray diffraction data analysis and pole‐figure calculations.
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- Journal of Applied Crystallography, 2019, v. 52, n. 3, p. 683, doi. 10.1107/S1600576719004485
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- Article