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Surface evolution of sputtered Cu(In,Ga)Se thin films under various annealing temperatures.
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- Journal of Materials Science: Materials in Electronics, 2015, v. 26, n. 7, p. 4840, doi. 10.1007/s10854-015-2991-6
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- Article
Investigation of chalcopyrite film growth at various temperatures: analyses from top to the bottom of the thin films.
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- Journal of Materials Science: Materials in Electronics, 2014, v. 25, n. 5, p. 2237, doi. 10.1007/s10854-014-1864-8
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- Article
Growth and Characterization of Totally Relaxed InGaAs Thick Layers on Strain-Relaxed Paramorphic InP Substrates.
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- Journal of Electronic Materials, 2004, v. 33, n. 7, p. 833, doi. 10.1007/s11664-004-0250-3
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- Article
Microstructure and mechanical properties of AlN films obtained by plasma enhanced chemical vapor deposition.
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- Journal of Materials Science, 2009, v. 44, n. 22, p. 6125, doi. 10.1007/s10853-009-3847-3
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- Article
Electric field induced avalanche breakdown and non-volatile resistive switching in the Mott Insulators AMQ.
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- European Physical Journal: Special Topics, 2013, v. 222, n. 5, p. 1046, doi. 10.1140/epjst/e2013-01905-1
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- Article