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Combined Influence of Gate Oxide and Back Oxide Materials on Self-Heating and DIBL Effect in 2D MOS 2 -Based MOSFETs.
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- Applied Sciences (2076-3417), 2023, v. 13, n. 10, p. 6131, doi. 10.3390/app13106131
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Lateral Capacitance–Voltage Method of NanoMOSFET for Detecting the Hot Carrier Injection.
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- Applied Sciences (2076-3417), 2020, v. 10, n. 21, p. 7935, doi. 10.3390/app10217935
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- Article
Contribution to the Physical Modelling of Single Charged Defects Causing the Random Telegraph Noise in Junctionless FinFET.
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- Applied Sciences (2076-3417), 2020, v. 10, n. 15, p. 5327, doi. 10.3390/app10155327
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- Article