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Isotopic comparative method (ICM) for the determination of variations of the ion yields in boron-doped silicon as a function of oxygen concentration in the 0-10 at.% range.
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- Surface & Interface Analysis: SIA, 2011, v. 43, n. 1/2, p. 137, doi. 10.1002/sia.3657
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The isotopic comparative method (ICM) for SIMS quantification of boron in silicon up to 40 at.%.
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- Surface & Interface Analysis: SIA, 2011, v. 43, n. 1/2, p. 36, doi. 10.1002/sia.3629
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- Article
Le management responsable. Vers un nouveau comportement des entreprises?
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- Revue Française de Gestion, 2006, n. 167, p. 206
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- Article