Back to matchesWe found a matchYour institution may have rights to this item. Sign in to continue.TitleObjective Point Symmetry Classifications/Quantifications of an Electron Diffraction Spot Pattern with Pseudo-Hexagonal Lattice Metric.AuthorsMoeck, Peter; von Koch, LukasPublicationMicroscopy & Microanalysis, 2022, Vol 28, p2496ISSN1431-9276Publication typeAbstractDOI10.1017/S1431927622009552