Found: 11
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Correlative XPS Analysis of a Novel Material System Generated Using a Combinatorial Approach.
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- Microscopy & Microanalysis, 2024, v. 30, p. 1, doi. 10.1093/mam/ozae044.265
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- Article
Advances in surface chemical analysis of thin film solid-state battery materials and development of operando measurement capability.
- Published in:
- 2021
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- Abstract
Advances in surface chemical analysis of thin film solid-state battery materials and development of operando measurement capability.
- Published in:
- 2021
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- Abstract
Chemical Surface Analysis of Materials: Recent Developments and the Tremendous Growth in Demand for the Technique.
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- 2020
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- Abstract
Chemical Surface Analysis of Materials: Recent Developments and the Tremendous Growth in Demand for the Technique.
- Published in:
- 2020
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- Abstract
Recent Developments in XPS - Microspectroscopy, Spectromicroscopy, Lateral and Depth Information towards Cutting-Edge Solid Electrolytes and Biomaterials.
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- 2019
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- Abstract
Recent Developments in XPS - Microspectroscopy, Spectromicroscopy, Lateral and Depth Information towards Cutting-Edge Solid Electrolytes and Biomaterials.
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- 2018
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- Abstract
The Use of Argon Cluster Ion Sources in Etching of Inorganic Materials with Reduced Chemical Damage: Toward a Better Understanding of Interface Chemistry.
- Published in:
- Microscopy & Microanalysis, 2014, v. 20, n. S3, p. 2094, doi. 10.1017/S1431927614012203
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- Article
The Role of Acidity in Terephthalic Acid Synthesis from Renewable Carbon Source.
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- ChemCatChem, 2020, v. 12, n. 24, p. 6248, doi. 10.1002/cctc.202001388
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- Article
Intensity calibration and sensitivity factors for XPS instruments with monochromatic Ag Lα and Al Kα sources.
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- Surface & Interface Analysis: SIA, 2019, v. 51, n. 7, p. 763, doi. 10.1002/sia.6647
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- Article
Sample rotation improves gas cluster sputter depth profiling of polymers.
- Published in:
- Surface & Interface Analysis: SIA, 2017, v. 49, n. 10, p. 953, doi. 10.1002/sia.6250
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- Article