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- Title
Analysis and filtering of scanning probe images.
- Authors
Khlopov, D.; Leesment, S.; Karban', O.; Nemtsova, O.; Zhurbin, I.
- Abstract
Two methods for processing and filtering of images obtained by scanning probe microscopy (SPM) are proposed. The data recovery algorithm not only locates line faults, but also restores distorted brightness heights. A self-consistent rank high-pass filter highlights the boundaries of scanned objects. The results of the processing of model structures demonstrate the advantages of the proposed filtering methods.
- Publication
Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2011, Vol 5, Issue 3, p539
- ISSN
1027-4510
- Publication type
Article
- DOI
10.1134/S1027451011060115