Back to matchesWe found a matchYour institution may have rights to this item. Sign in to continue.Titlep-polarized infrared attenuated total reflection study of InN thin films grown on Si(111) substrate.AuthorsNg, S. S.; Lee, S. C.; Ooi, P. K.; Hassan, Z.; Abu Hassan, H.; Chen, W. L.PublicationPhysica Status Solidi - Rapid Research Letters, 2010, Vol 4, Issue 8/9, p191ISSN1862-6254Publication typeArticleDOI10.1002/pssr.201004173