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- Title
Polarised EXAFS Study of In-Plane Distortion in a Pr-Doped BSCCO (2212) Single Crystal.
- Authors
Dalela, S.; Dalela, B.; Chaturvedi, D.; Singhal, R. K.; Jain, D. C.; Garg, K. B.; Lee, J. F.; Choy, J. H.
- Abstract
Polarised EXAFS measurements on the Cu K edge in a Pr-doped BSCCO (2212) insulating single crystal have been made at room temperature at the SRRC, Taiwan. Measurements have been confined to only the E//a, E//a^45 and E//b directions within the Cu-O[sub 2] plane as most of the action is here. While the spectra in the E//a and E//b look very similar, the E//a^45 spectrum does look a little different. EXAFS analysis shows that Cu-O (planar) distances as well as the Debye Waller factor values in different directions turn out to be slightly different indicating a possibility of presence of some in-plane distortion. This appears to be very much in agreement with our XANES results on this system and our EXAFS results on Pr-doped YBCO (123) system reported earlier, which also indicate the presence of some distortion. Presence of Pr is speculated to be the cause for producing this distortion. This would be discussed in some detail taking into account the possibility that Pr, besides quenching holes, may also be displacing the in-plane oxygens.
- Subjects
CRYSTALS; SEMICONDUCTOR doping; EXTENDED X-ray absorption fine structure
- Publication
International Journal of Modern Physics B: Condensed Matter Physics; Statistical Physics; Applied Physics, 2000, Vol 14, Issue 29/31, p3432
- ISSN
0217-9792
- Publication type
Article
- DOI
10.1142/S0217979200003915