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- Title
Geometric Aberration Theory of Offner Imaging Spectrometers.
- Authors
Zhao, Meihong; Jiang, Yanxiu; Yang, Shuo; Li, Wenhao
- Abstract
A third-order aberration theory has been developed for the Offner imaging spectrometer comprising an extended source; two concave mirrors; a convex diffraction grating; and an image plane. Analytic formulas of the spot diagram are derived for tracing rays through the system based on Fermat's principle. The proposed theory can be used to discuss in detail individual aberrations of the system such as coma, spherical aberration and astigmatism, and distortion together with the focal conditions. It has been critically evaluated as well in a comparison with exact ray tracing constructed using the commercial software ZEMAX. In regard to the analytic formulas, the results show a high degree of practicality.
- Subjects
DIFFRACTION gratings; SPECTROMETERS; MICROPLATES; RAY tracing; OPTICAL aberrations; ASTIGMATISM; ASTIGMATISM (Optics); IMAGE
- Publication
Sensors (14248220), 2019, Vol 19, Issue 18, p4046
- ISSN
1424-8220
- Publication type
Article
- DOI
10.3390/s19184046