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- Title
Direct Imaging of Current-Induced Transformation of a Perovskite/Electrode Interface.
- Authors
Drozdov, Mikhail N.; Yunin, Pavel A.; Travkin, Vlad V.; Koptyaev, Andrey I.; Pakhomov, Georgy L.
- Abstract
Formamidinium-lead-iodide (FAPbI3) perovskite films are subjected to a long-term action of the constant electrical current in the dark, using planar vacuum-deposited gold electrodes. The current-induced transformation is monitored by the time-of-flight secondary ion mass spectrometry (ToF-SIMS) mapping complemented by microscopic, spectroscopic methods, and X-ray diffraction. The migration of chemical species inside the lateral interelectrode gap is clearly visualized by ToF-SIMS. Those species correspond to both electrode material and perovskite itself, so that the perovskite/electrode interface becomes disrupted. As a result, the interelectrode gap shrinks, which is reflected in the surface images.
- Subjects
TIME-of-flight mass spectrometry; SECONDARY ion mass spectrometry; GOLD electrodes; PEROVSKITE; ELECTRODES
- Publication
Advanced Materials Interfaces, 2019, Vol 6, Issue 12, p1
- ISSN
2196-7350
- Publication type
Article
- DOI
10.1002/admi.201900364