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- Title
Polarized XAFS Analyses for MgB Thin Films.
- Authors
Miyanaga, T.; Matsumura, R.; Seo, M.; Takeda, K.; Hatanaka, D.; Yoshizawa, M.
- Abstract
The local structure of 10, 20, and 30-nm MgB thin films prepared by molecular beam epitaxy (MBE) is analyzed by polarized X-ray absorption fine structure (XAFS) of Mg K-edge, which is a powerful tool for structural analysis with element selectivity using a synchrotron radiation source. The structural parameters are obtained from extended X-ray absorption fine structure (EXAFS) analysis for 20-nm MgB film. X-ray near edge structure (XANES) analysis estimated the proportion of MgO inserted between the MgB film and ZnO substrate. The linear relation is found between the MgO proportion and T .
- Subjects
X-ray absorption near edge structure; THIN film devices; SYNCHROTRON radiation; SUPERCONDUCTIVITY; MOLECULAR beam epitaxy
- Publication
Journal of Superconductivity & Novel Magnetism, 2017, Vol 30, Issue 6, p1665
- ISSN
1557-1939
- Publication type
Article
- DOI
10.1007/s10948-017-3991-y