Back to matchesWe found a matchYour institution may have rights to this item. Sign in to continue.TitleSputter reduction of oxides by ion bombardment during Auger depth profile analysis.AuthorsMitchell, D. F.; Sproule, G. I.; Graham, M. J.PublicationSurface & Interface Analysis: SIA, 1990, Vol 15, Issue 8, p487ISSN0142-2421Publication typeArticleDOI10.1002/sia.740150808