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- Title
Characterization of Amorphous Oxide Nano-Thick Layers on 316L Stainless Steel by Electron Channeling Contrast Imaging and Electron Backscatter Diffraction.
- Authors
Dorri, Mahrokh; Turgeon, Stéphane; Brodusch, Nicolas; Cloutier, Maxime; Chevallier, Pascale; Gauvin, Raynald; Mantovani, Diego
- Abstract
Characterization of the topmost surface of biomaterials is crucial to understanding their properties and interactions with the local environment. In this study, the oxide layer microstructure of plasma-modified 316L stainless steel (SS316L) samples was analyzed by a combination of electron backscatter diffraction and electron channeling contrast imaging using low-energy incident electrons. Both techniques allowed clear identification of a nano-thick amorphous oxide layer, on top of the polycrystalline substrate, for the plasma-modified samples. A methodology was developed using Monte Carlo simulations combined with the experimental results to estimate thickness of the amorphous layer for different surface conditions. X-ray photoelectron spectroscopy depth profiles were used to validate these estimations.
- Publication
Microscopy & Microanalysis, 2016, Vol 22, Issue 5, p997
- ISSN
1431-9276
- Publication type
Article
- DOI
10.1017/S1431927616011612