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- Title
Atomic Structures of Oxygen-associated Defects in Sintered Aluminum Nitride Ceramics.
- Authors
Yan, Yanfa; Pennycook, S. J.; Terauchi, M.; Tanaka, M.
- Abstract
Convergent-beam electron diffraction and Z-contrast imaging are used to study oxygen-associated defects, flat inversion domain boundaries, dislocations, and interfaces in sintered AlN ceramics. The structures of these defects are directly derived from atomic-resolution Z-contrast images. The flat inversion domain boundaries contain a single Al-O octahedral layer and have a stacking sequence of . . .bAaB-bAc-CaAc. . , where -cAb- indicates the single octahedral layer. The expansion at the flat inversion domain boundaries is measured to be 0.06 (±0.02) nm. The interfaces between 2H- and polytypoid-AlN are found to be also inversion domain boundaries but their stacking sequence differs from that of the flat inversion domain boundaries.
- Publication
Microscopy & Microanalysis, 1999, Vol 5, Issue 5, p352
- ISSN
1431-9276
- Publication type
Article
- DOI
10.1017/S1431927699000185