Back to matchesWe found a matchYour institution may have rights to this item. Sign in to continue.TitleEXAFS study of NiAl in thin films.AuthorsArčon, Iztok; Mozetič, Miran; Kodre, Alojz; Jagielski, Jacek; Traverse, AgnesPublicationJournal of Synchrotron Radiation, 2001, Vol 8, Issue 2, p493ISSN0909-0495Publication typeArticleDOI10.1107/S0909049500016642