Back to matchesWe found a matchYour institution may have rights to this item. Sign in to continue.TitleElectronic Modulation Caused by Interfacial Ni‐O‐M (M=Ru, Ir, Pd) Bonding for Accelerating Hydrogen Evolution Kinetics.AuthorsDeng, Liming; Hu, Feng; Ma, Mingyue; Huang, Shao‐Chu; Xiong, Yixing; Chen, Han‐Yi; Li, Linlin; Peng, ShengjiePublicationAngewandte Chemie International Edition, 2021, Vol 60, Issue 41, p22276ISSN1433-7851Publication typeArticleDOI10.1002/anie.202110374