Back to matchesWe found a matchYour institution may have rights to this item. Sign in to continue.TitleEmploying Atomic Force Microscopy (AFM) for Microscale Investigation of Interfaces and Interactions in Membrane Fouling Processes: New Perspectives and Prospects.AuthorsWei, Mohan; Zhang, Yaozhong; Wang, Yifan; Liu, Xiaoping; Li, Xiaoliang; Zheng, XingPublicationMembranes, 2024, Vol 14, Issue 2, p35ISSN2077-0375Publication typeArticleDOI10.3390/membranes14020035