Back to matchesWe found a matchYour institution may have rights to this item. Sign in to continue.TitleDetermination of thickness and composition of thin films by x-ray fluorescence spectrometry using theoretical influence coefficient algorithms.AuthorsSitko, RafałPublicationXRS: X-ray Spectrometry, 2008, Vol 37, Issue 3, p265ISSN0049-8246Publication typeArticleDOI10.1002/xrs.1012