Back to matchesWe found a matchYour institution may have rights to this item. Sign in to continue.TitleRecent Progress of Correlative Transmission Electron Microscopy and Atom Probe Tomography for Materials Characterization.AuthorsWei Guo; Sneed, Brian T.; Yifei Meng; Cullen, David A.; Jian-min Zuo; Poplawsky, Jonathan D.PublicationMicroscopy & Microanalysis, 2017, Vol 23, p692ISSN1431-9276Publication typeArticleDOI10.1017/S1431927617004123