Back to matchesWe found a matchYour institution may have rights to this item. Sign in to continue.TitleReciprocal space mapping and strain scanning using X‐ray diffraction microscopy.AuthorsPoulsen, H. F.; Cook, P. K.; Leemreize, H.; Pedersen, A. F.; Yildirim, C.; Kutsal, M.; Jakobsen, A. C.; Trujillo, J. X.; Ormstrup, J.; Detlefs, C.PublicationJournal of Applied Crystallography, 2018, Vol 51, Issue 5, p1428ISSN0021-8898Publication typeArticleDOI10.1107/S1600576718011378