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- Title
Microstructural Characterization of Spin-Valve Multilayers by X-ray Anomalous Diffraction Technique.
- Authors
Liu, C. X.; Xu, M.; Luo, G. M.; Yang, T.; Chai, C. C.; Mai, Z. H.; Lai, W. Y.; Jiang, H. Y.; Wu, Z. H.; Ding, Y. F.; Wang, J.
- Abstract
It is impossible to directly analyze the microstructure of spin-valve multilayers based on Ni, Fe, Cu and Mn by a conventional X-ray diffraction technique because the lattice parameter and atomic scattering factors of them are very close. To solve this problem, we use an X-ray anomalous diffraction technique to characterize the microstructures of the [Ni[sub 80]Fe[sub 20]/Fe[sub 50]Mn[sub 50]][sub 15] and [Ni[sub 80]Fe[sub 20]/Cu][sub 15] superlattice systems. The results show that more diffraction peaks and higher intensity in the reflectivity profile are observed when the incident energy is close to the absorption edge of the lighter element (Mn) in [Ni[sub 80]Fe[sub 50]/Fe[sub 50]Mn[sub 50]][sub 15] multilayer systems and to the absorption edge of the heavier element (Cu) in the [Ni[sub 80]Fe[sub 20]/Cu][sub 15] multilayer systems. The interface and periodic structure of [Ni[sub 80]Fe[sub 20]/Fe[sub 50]Mn[sub 50]][sub 15] are more perfect than that of the [Ni[sub 80]Fe[sub 20]/Cu][sub 15] superlattices. The above results are discussed in this paper.
- Subjects
MICROSTRUCTURE; MAGNETORESISTANCE; SUPERLATTICES; PHYSICS
- Publication
Modern Physics Letters B, 2001, Vol 15, Issue 9/10, p291
- ISSN
0217-9849
- Publication type
Article
- DOI
10.1142/S0217984901001732