Back to matchesWe found a matchYour institution may have rights to this item. Sign in to continue.TitlePseudo-dynamic testing using conventional testing devices.AuthorsNakashima, Masayoshi; Akazawa, Takashi; Igarashi, HideichiPublicationEarthquake Engineering & Structural Dynamics, 1995, Vol 24, Issue 10, p1409ISSN0098-8847Publication typeArticleDOI10.1002/eqe.4290241009