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- Title
Black Phosphorus: Thickness‐Dependent Structural Stability and Anisotropy of Black Phosphorus (Adv. Electron. Mater. 3/2019).
- Authors
Chen, Zhongwei; Deng, Kerong; Luo, Shuiping; Quan, Zewei; Li, Qian; Huang, Hao; Yu, Xuefeng; Huang, Xin; Wang, Zhongwu
- Abstract
In article number 1800712, Zewei Quan and co‐workers study the structural variations of black phosphorus (BP) with a tunable thickness from ∼71 nm down to ∼6 nm. Both the thickness‐dependent phase diagram and anisotropic compressibility are summarized and used to construct thickness‐pressure‐structure relations. The thickness‐dependent structural responses provide valuable information towards controllable design and fabrication of BP‐based devices for applications.
- Subjects
ELECTRONIC materials; PHOSPHORUS
- Publication
Advanced Electronic Materials, 2019, Vol 5, Issue 3, pN.PAG
- ISSN
2199-160X
- Publication type
Article
- DOI
10.1002/aelm.201970012