Back to matchesWe found a matchYour institution may have rights to this item. Sign in to continue.TitleSimulation of atomic image profiles in dark field electron microscopy.AuthorsKorn, Alex P.PublicationJournal of Microscopy, 1984, Vol 136, Issue 3, p305ISSN0022-2720Publication typeArticleDOI10.1111/j.1365-2818.1984.tb00539.x