Back to matchesWe found a matchYour institution may have rights to this item. Sign in to continue.TitleInfluence of argon pressure on the depth resolution during GDOES depth profiling analysis of thin films.AuthorsShimizu, K.; Habazaki, H.; Skeldon, P.; Thompson, G. E.; Wood, G. C.PublicationSurface & Interface Analysis: SIA, 2000, Vol 29, Issue 2, p155ISSN0142-2421Publication typeArticleDOI10.1002/(SICI)1096-9918(200002)29:2<155::AID-SIA729>3.0.CO;2-G