Back to matchesWe found a matchYour institution may have rights to this item. Sign in to continue.TitleSIMS Based Correlative Microscopy for High-Resolution High-Sensitivity Nano-Analytics.AuthorsWirtz, T.; Dowsett, D.; Eswara Moorthy, S.; Fleming, Y.PublicationMicroscopy & Microanalysis, 2014, Vol 20, Issue S3, p966ISSN1431-9276Publication typeArticleDOI10.1017/S1431927614006552