Back to matchesWe found a matchYour institution may have rights to this item. Sign in to continue.TitleDefect analysis of star defects in GaN thin films grown on HVPE GaN substrates.AuthorsRuggles, Tim; Deitz, Julia; Allerman, Andrew; Carter, C. Barry; Michael, JosephPublicationMicroscopy & Microanalysis, 2021, Vol 27, p916ISSN1431-9276Publication typeAbstractDOI10.1017/S1431927621003512