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- Title
Capability measures for processes with multiple characteristics.
- Authors
Chen, K. S.; Pearn, W. L.; Lin, P. C.
- Abstract
Process capability indices, such as <UEQN>$C_p$</UEQN>, <UEQN>$C_a$</UEQN>, and <UEQN>$C_{pk}$</UEQN>, have been widely used in the manufacturing industry providing numerical measures on process precision, process accuracy, and process performance. Capability measures for processes with a single characteristic have been investigated extensively. However, capability measures for processes with multiple characteristics are comparatively neglected. In this paper, we consider a generalization of the yield index <UEQN>$S_{pk}$</UEQN> proposed by Boyles, for processes with multiple characteristics. We establish a relationship between the generalization and the process yield. We also develop a control chart based on the proposed generalization, which displays all the characteristic measures in one single chart. Using the chart, the engineers can effectively monitor and control the performance of all process characteristics simultaneously. Copyright © 2003 John Wiley & Sons, Ltd.
- Subjects
INDEXES; MANUFACTURING processes; PRODUCTION engineering; PRODUCTION methods; INDUSTRIAL engineering
- Publication
Quality & Reliability Engineering International, 2003, Vol 19, Issue 2, p101
- ISSN
0748-8017
- Publication type
Article
- DOI
10.1002/qre.513