We found a match
Your institution may have rights to this item. Sign in to continue.
- Title
Generation-Recombination Noise: The Fundamental Sensitivity Limit for Kinetic Inductance Detectors.
- Authors
Visser, P.; Baselmans, J.; Diener, P.; Yates, S.; Endo, A.; Klapwijk, T.
- Abstract
We present measurements of quasiparticle generation-recombination noise in aluminium Microwave Kinetic Inductance Detectors, the fundamental noise source for these detectors. Both the quasiparticle lifetime and the number of quasiparticles can be determined from the noise spectra. The number of quasiparticles saturates to 10 μm at temperatures below 160 mK, which is shown to limit the quasiparticle lifetime to 4 ms. These numbers lead to a generation-recombination noise limited noise equivalent power (NEP) of 1.5×10 W/Hz. Since NEP∝ N, lowering the number of remnant quasiparticles will be crucial to improve the sensitivity of these detectors. We show that the readout power now limits the number of quasiparticles and thereby the sensitivity.
- Subjects
QUASIPARTICLES; PHOTON detectors; ELECTRIC noise; ALUMINUM; MICROWAVES; TEMPERATURE effect; SENSITIVITY analysis
- Publication
Journal of Low Temperature Physics, 2012, Vol 167, Issue 3/4, p335
- ISSN
0022-2291
- Publication type
Article
- DOI
10.1007/s10909-012-0519-5