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The N4-21 Voltage Standard Based on Josephson Junctions of High-Temperature Superconductors.
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- Measurement Techniques, 2018, v. 60, n. 12, p. 1216, doi. 10.1007/s11018-018-1342-4
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- Article
Electron Energy Conversion to EUV Radiation in the K<sub>α</sub> Line of Be in the "Shooting Through" Geometry.
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- Journal of Experimental & Theoretical Physics, 2018, v. 127, n. 6, p. 985, doi. 10.1134/S1063776118100175
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- Article
Nonlinear microwave properties of YBa<sub>2</sub>Cu<sub>3</sub>O<sub>7− x </sub> block epitaxial films near the superconducting transition temperature.
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- Journal of Experimental & Theoretical Physics, 2007, v. 105, n. 1, p. 246, doi. 10.1134/S1063776107070540
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Analysis of cross-correlation of interface roughness in multilayer structures with ultrashort periods.
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- Journal of Experimental & Theoretical Physics, 2006, v. 103, n. 3, p. 346, doi. 10.1134/S1063776106090020
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- Article
Investigation of the Angular Dependences of the Velocities of Ion-Beam Sputtering of Metals for the Synthesis of Mask Blanks.
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- Technical Physics, 2024, v. 69, n. 6, p. 1683, doi. 10.1134/S106378422406029X
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Dispersion Elements for X-ray Mirror Spectrometer on a Range of 7–30 nm.
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- Technical Physics, 2024, v. 69, n. 6, p. 1568, doi. 10.1134/S1063784224060136
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- Article
Investigation of the Angular Dependences of the Velocities of Ion-Beam Sputtering of Metals for the Synthesis of Mask Blanks.
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- Technical Physics, 2024, v. 69, n. 5, p. 1279, doi. 10.1134/S1063784224040248
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Emission Characteristics of a Laser-Plasma Source of Extreme Ultraviolet Radiation with Thin-Film Targets.
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- Technical Physics, 2024, v. 69, n. 5, p. 1259, doi. 10.1134/S1063784224040212
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Measurements of the Absolute Values of the Radiation Intensity in the Wavelength Range of 6.6–32 nm of Stainless Steel Targets with Pulsed Laser Excitation.
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- Technical Physics, 2024, v. 69, n. 4, p. 870, doi. 10.1134/S1063784224030125
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- Article
Study of the Influence of the Energy of Argon Ions on the Surface Roughness of the Main Sections of Single-Crystal Silicon.
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- Technical Physics, 2024, v. 69, n. 4, p. 959, doi. 10.1134/S1063784224030265
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- Article
Application of Cerium Oxide Nanopowders for Silicon Polishing.
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- Technical Physics, 2024, v. 69, n. 4, p. 824, doi. 10.1134/S106378422403006X
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- Article
Diamond–Carbide–Silicon Composite "Skeleton" as a Promising Material for X-Ray Optical Substrates.
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- Technical Physics, 2024, v. 69, n. 3, p. 780, doi. 10.1134/S1063784224020403
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- Article
Wavefront Lens Corrector for Studying Flat Surfaces.
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- Technical Physics, 2024, v. 69, n. 3, p. 730, doi. 10.1134/S1063784224020336
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- Article
Study of the Influence of the Energy of Argon Ions on the Surface Roughness of the Main Sections of Single-Crystal Silicon.
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- Technical Physics, 2024, v. 69, n. 3, p. 624, doi. 10.1134/S1063784224020233
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- Article
Solar VUV Telescope for Nanosatellites.
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- Technical Physics, 2024, v. 69, n. 3, p. 595, doi. 10.1134/S1063784224020191
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- Article
Manufacturing and Research of Mirrors with a Wide Bandwidth for Synchrotron Applications.
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- Technical Physics, 2024, v. 69, n. 3, p. 468, doi. 10.1134/S1063784224020038
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- Article
Imaging System of a Plasma Torch of a Betatron X-Ray Source.
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- Technical Physics, 2024, v. 69, n. 3, p. 480, doi. 10.1134/S1063784224020051
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Model of Physical Sputtering of Amorphous Materials.
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- Technical Physics, 2024, v. 69, n. 2, p. 349, doi. 10.1134/S1063784224010304
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- Article
Thin Film Al Targets for a Laser-Plasma Source of Extreme Ultraviolet Radiation.
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- Technical Physics, 2024, v. 69, n. 2, p. 229, doi. 10.1134/S1063784224010134
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- Article
Material Surface Treatment for Design of Composite Optical Elements.
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- Technical Physics, 2020, v. 65, n. 11, p. 1828, doi. 10.1134/S1063784220110286
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- Article
Ion-Beam Methods for High-Precision Processing of Optical Surfaces.
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- Technical Physics, 2020, v. 65, n. 11, p. 1837, doi. 10.1134/S1063784220110274
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- Article
Modification and Polishing of the Holographic Diffraction Grating Grooves by a Neutralized Ar Ion Beam.
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- Technical Physics, 2020, v. 65, n. 11, p. 1780, doi. 10.1134/S1063784220110110
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- Article
Prospects for the Use of X-Ray Tubes with a Field-Emission Cathode and a Through-Type Anode in the Range of Soft X-Ray Radiation.
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- Technical Physics, 2020, v. 65, n. 11, p. 1726, doi. 10.1134/S1063784220110043
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- Article
Beryllium as a Material for Thermally Stable X-Ray Mirrors.
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- Technical Physics, 2019, v. 64, n. 11, p. 1596, doi. 10.1134/S1063784219110070
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- Article
Simulation of Local Error Correction of the Surface Shape by a Low-Dimensional Ion Beam.
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- Technical Physics, 2019, v. 64, n. 11, p. 1560, doi. 10.1134/S1063784219110069
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- Article
Phase transitions in hybrid SFS structures with thin superconducting layers.
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- JETP Letters, 2016, v. 104, n. 5, p. 329, doi. 10.1134/S0021364016170148
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- Article
Study of the Nonlinear Response of Superconductors in the Microwave Band Using a Local Technique.
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- Radiophysics & Quantum Electronics, 2003, v. 46, n. 2, p. 109, doi. 10.1023/A:1023949506091
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- Article
Peculiarities of the Resistive State in Mo/Si Superlattices in a Magnetic Field.
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- Modern Physics Letters B, 2003, v. 17, n. 10, p. 627, doi. 10.1142/S0217984903005652
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- Article
The diamond–silicon carbide composite Skeleton<sup>®</sup> as a promising material for substrates of intense X‐ray beam optics.
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- Journal of Synchrotron Radiation, 2024, v. 31, n. 5, p. 1179, doi. 10.1107/S1600577524006088
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- Article
On the Formation of an Anti-Reflection Layer on the Surface of Single-Crystal Silicon by Ion-Beam Etching.
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- Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2023, v. 17, p. S259, doi. 10.1134/S1027451023070583
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- Article
Study of the Influence of Ion-Beam Etching on the Surface Roughness of Single-Crystal Sapphire.
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- Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2023, v. 17, n. 6, p. 1338, doi. 10.1134/S102745102306037X
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Prospects for the Application of Liquid Glass for Smoothing the Surface of Optical Elements.
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- Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2023, v. 17, n. 6, p. 1332, doi. 10.1134/S1027451023060368
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On the Project of Scanning and Projection Microscopes for the Nanoscope Station for Biological Research in the Water Window.
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- Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2023, v. 17, n. 3, p. 531, doi. 10.1134/S1027451023030114
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- Article
Creation of Composite Optical Elements by the Ion-Beam Surface-Activation Method for Laser Applications.
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- Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2020, v. 14, n. 5, p. 1016, doi. 10.1134/S1027451020050316
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Projection Objective For an EUV-Lithographic Workbench.
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- Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2020, v. 14, n. 3, p. 562, doi. 10.1134/S1027451020030246
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Miniature Ion Source KLAN-10M with a Plasma Neutralizer.
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- Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2019, v. 13, n. 2, p. 182, doi. 10.1134/S1027451019020149
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Current State of Development of a Microscope Operating at a Wavelength of 3.37 nm at the Institute of Physics of Microstructures of the Russian Academy of Sciences.
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- Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2018, v. 12, n. 6, p. 1253, doi. 10.1134/S1027451019010129
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On the cryocooler-based cooling of Josephson microchips fabricated from cuprate superconductors for use in voltage standards.
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- Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2016, v. 10, n. 2, p. 302, doi. 10.1134/S1027451016020154
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- Article
Transmission of Transverse Magnetization in Spin-Exchange Collisions of Alkali Metal Atoms.
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- Technical Physics Letters, 2018, v. 44, n. 10, p. 860, doi. 10.1134/S1063785018100036
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- Article