Back to matchesWe found a matchYour institution may have rights to this item. Sign in to continue.TitleAnalysis of organic multilayered samples for optoelectronic devices by (low-energy) dynamic SIMS.AuthorsNgo, K. Q.; Philipp, P.; Jin, Y.; Morris, S. E.; Shtein, M.; Kieffer, J.; Wirtz, T.PublicationSurface & Interface Analysis: SIA, 2011, Vol 43, Issue 1/2, p194ISSN0142-2421Publication typeArticleDOI10.1002/sia.3451