Back to matchesWe found a matchYour institution may have rights to this item. Sign in to continue.TitleThree dimensional characterization of interfaces using aberration-corrected STEM.Authorsvan Benthem, K.; Borisevich, A. Y.; Chisholm, M. F.; Lupini, A. R.; Pantelides, S. T.; Rashkeev, S.; Varela, M.; Pennycook, S. J.PublicationMicroscopy & Microanalysis, 2005, Vol 11, p1452ISSN1431-9276Publication typeArticleDOI10.1017/S1431927605510055