Back to matchesWe found a matchYour institution may have rights to this item. Sign in to continue.TitleMulticrystalline Informatics Applied to Multicrystalline Silicon for Unraveling the Microscopic Root Cause of Dislocation Generation.AuthorsYamakoshi, Kenta; Ohno, Yutaka; Kutsukake, Kentaro; Kojima, Takuto; Yokoi, Tatsuya; Yoshida, Hideto; Tanaka, Hiroyuki; Liu, Xin; Kudo, Hiroaki; Usami, NoritakaPublicationAdvanced Materials, 2024, Vol 36, Issue 8, p1ISSN0935-9648Publication typeArticleDOI10.1002/adma.202308599