Found: 14
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XPS, XANES and ToF-SIMS Characterization of Reactively Magnetron-sputtered Carbon Nitride Films.
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- Surface & Interface Analysis: SIA, 1997, v. 25, n. 10, p. 827, doi. 10.1002/(SICI)1096-9918(199709)25:10<827::AID-SIA331>3.0.CO;2-W
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Detection of Nylon-6,6 Cyclic Monomers on Polymer Surfaces using Static SIMS.
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- Surface & Interface Analysis: SIA, 1997, v. 25, n. 10, p. 799, doi. 10.1002/(SICI)1096-9918(199709)25:10<799::AID-SIA302>3.0.CO;2-M
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Spectral Noise Distortion in Photoelectron Spectroscopy by Acquiring Data with Multidetector Systems.
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- Surface & Interface Analysis: SIA, 1997, v. 25, n. 10, p. 823, doi. 10.1002/(SICI)1096-9918(199709)25:10<823::AID-SIA306>3.0.CO;2-W
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SIMS Detection in the 10<sup>12</sup> Atoms cm<sup>-3</sup> Range.
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- Surface & Interface Analysis: SIA, 1997, v. 25, n. 10, p. 737, doi. 10.1002/(SICI)1096-9918(199709)25:10<737::AID-SIA294>3.0.CO;2-M
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Comparison of FEG-STEM and AES Measurements of Equilibrium Segregation of Phosphorus in 9% Cr Ferritic Steels.
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- Surface & Interface Analysis: SIA, 1997, v. 25, n. 10, p. 760, doi. 10.1002/(SICI)1096-9918(199709)25:10<760::AID-SIA298>3.0.CO;2-S
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ToF-SIMS Determination of Molecular Weights from Polymeric Surfaces and Microscopic Phases.
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- Surface & Interface Analysis: SIA, 1997, v. 25, n. 10, p. 790, doi. 10.1002/(SICI)1096-9918(199709)25:10<790::AID-SIA301>3.0.CO;2-F
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A Novel Approach for the Determination of the Actual Incidence Angle in a Magnetic-sector SIMS Instrument.
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- Surface & Interface Analysis: SIA, 1997, v. 25, n. 10, p. 817, doi. 10.1002/(SICI)1096-9918(199709)25:10<817::AID-SIA305>3.0.CO;2-O
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Scanning Near-field Optical Microscope Designed for Operation in Liquids.
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- Surface & Interface Analysis: SIA, 1997, v. 25, n. 10, p. 755, doi. 10.1002/(SICI)1096-9918(199709)25:10<755::AID-SIA297>3.0.CO;2-H
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Topographic Correction of 3D SIMS Images.
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- Surface & Interface Analysis: SIA, 1997, v. 25, n. 10, p. 788, doi. 10.1002/(SICI)1096-9918(199709)25:10<788::AID-SIA300>3.0.CO;2-W
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XPS Study of the Segregation of Minor Elements at the Surface of a Commercial Copper-10 wt.% Nickel Alloy.
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- Surface & Interface Analysis: SIA, 1997, v. 25, n. 10, p. 747, doi. 10.1002/(SICI)1096-9918(199709)25:10<747::AID-SIA296>3.0.CO;2-F
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Chemical Analysis of Ternary Ti Oxides using Soft X-ray Absorption Spectroscopy.
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- Surface & Interface Analysis: SIA, 1997, v. 25, n. 10, p. 804, doi. 10.1002/(SICI)1096-9918(199709)25:10<804::AID-SIA303>3.0.CO;2-3
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XPS Studies of Oxide Growth and Segregation in Aluminium-Silicon Alloys.
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- Surface & Interface Analysis: SIA, 1997, v. 25, n. 10, p. 809, doi. 10.1002/(SICI)1096-9918(199709)25:10<809::AID-SIA304>3.0.CO;2-M
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Incorporation of Surface Topography in the XPS Analysis of Curved or Rough Samples Covered by Thin Multilayers.
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- Surface & Interface Analysis: SIA, 1997, v. 25, n. 10, p. 741, doi. 10.1002/(SICI)1096-9918(199709)25:10<741::AID-SIA295>3.0.CO;2-#
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Energy Calibration of X-ray Photoelectron Spectrometers. II. Issues in Peak Location and Comparison of Methods.
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- Surface & Interface Analysis: SIA, 1997, v. 25, n. 10, p. 777, doi. 10.1002/(SICI)1096-9918(199709)25:10<777::AID-SIA299>3.0.CO;2-3
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