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Inelastic Mean Free Path Data for Si Corrected for Surface Excitation.
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- Microscopy & Microanalysis, 2005, v. 11, n. 6, p. 581, doi. 10.1017/s1431927605050713
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Calendar of Meetings and Courses.
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- Microscopy & Microanalysis, 2005, v. 11, n. 6, p. 586, doi. 10.1017/s1431927605050701
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- Article
Electron Microscopy Studies of Potassium Sodium Niobate Ceramics.
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- Microscopy & Microanalysis, 2005, v. 11, n. 6, p. 572, doi. 10.1017/s1431927605050683
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AES Investigation of Inhomogenous Metal-Insulator Samples.
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- Microscopy & Microanalysis, 2005, v. 11, n. 6, p. 567, doi. 10.1017/s1431927605050658
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Characterization of Hydroxyapatite by Electron Microscopy.
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- Microscopy & Microanalysis, 2005, v. 11, n. 6, p. 516, doi. 10.1017/s1431927605050646
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Interaction of Oxide Surfaces with Water: Environmental Transmission Electron Microscopy of MgO Hydroxylation.
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- Microscopy & Microanalysis, 2005, v. 11, n. 6, p. 524, doi. 10.1017/s1431927605050403
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Misidentification of Major Constituents by Automatic Qualitative Energy Dispersive X-ray Microanalysis: A Problem that Threatens the Credibility of the Analytical Community.
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- Microscopy & Microanalysis, 2005, v. 11, n. 6, p. 545, doi. 10.1017/s1431927605050531
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Ultrastructure, Histochemistry, and Mineralization Patterns in the Ecdysial Suture of the Blue Crab, Callinectes sapidus.
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- Microscopy & Microanalysis, 2005, v. 11, n. 6, p. 479, doi. 10.1017/s1431927605050555
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Atomic Structure of β-Tantalum Nanocrystallites.
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- Microscopy & Microanalysis, 2005, v. 11, n. 6, p. 534, doi. 10.1017/s1431927605050543
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LaI2@(18,3)SWNT: The Unprecedented Structure of a LaI2 “Crystal,” Encapsulated within a Single-Walled Carbon Nanotube.
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- Microscopy & Microanalysis, 2005, v. 11, n. 5, p. 421, doi. 10.1017/s1431927605050324
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The Change of the LMM Auger Spectra in 3d-Metals Due to Oxidation and Its Correlation with the Change of the Atomic Magnetic Moment.
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- Microscopy & Microanalysis, 2005, v. 11, n. 6, p. 562, doi. 10.1017/s1431927605050622
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Microwave Processing for Sample Preparation to Evaluate Mitochondrial Ultrastructural Damage in Hemorrhagic Shock.
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- Microscopy & Microanalysis, 2005, v. 11, n. 6, p. 500, doi. 10.1017/s1431927605050567
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TEM Investigation of Nanophase Aluminum Powder.
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- Microscopy & Microanalysis, 2005, v. 11, n. 5, p. 410, doi. 10.1017/s1431927605050336
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Damage in III–V Compounds during Focused Ion Beam Milling.
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- Microscopy & Microanalysis, 2005, v. 11, n. 5, p. 446, doi. 10.1017/s1431927605050294
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diFiore's Atlas of Histology with Functional Correlations Victor P. Eroschenko.
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- Microscopy & Microanalysis, 2005, v. 11, n. 5, p. 472, doi. 10.1017/s1431927605000735
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Lorentz TEM Characterization of Al-Cu-Ge-Mn Alloys.
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- Microscopy & Microanalysis, 2005, v. 11, p. 1808, doi. 10.1017/S1431927605502320
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Effects of Inhibitors of Δ24(25)-Sterol Methyl Transferase on the Ultrastructure of Epimastigotes of Trypanosoma cruzi.
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- Microscopy & Microanalysis, 2005, v. 11, n. 6, p. 506, doi. 10.1017/s143192760505035x
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Erratum.
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- Microscopy & Microanalysis, 2005, v. 11, n. 5, p. 477, doi. 10.1017/s1431927605050749
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Introduction: Frontiers of Electron Microscopy in Materials Science.
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- Microscopy & Microanalysis, 2005, v. 11, n. 5, p. 377, doi. 10.1017/s1431927605050725
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- Article
Calendar of Meetings and Courses.
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- Microscopy & Microanalysis, 2005, v. 11, n. 5, p. 473, doi. 10.1017/s1431927605050671
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- Article
Searching Ultimate Nanometrology for AlOx Thickness in Magnetic Tunnel Junction by Analytical Electron Microscopy and X-ray Reflectometry.
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- Microscopy & Microanalysis, 2005, v. 11, n. 5, p. 431, doi. 10.1017/s1431927605050580
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Structure Determination of Atomically Controlled Crystal Architectures Grown within Single Wall Carbon Nanotubes.
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- Microscopy & Microanalysis, 2005, v. 11, n. 5, p. 401, doi. 10.1017/s1431927605050385
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Self-Assembled Nanostructures on VSe2 Surfaces Induced by Cu Deposition.
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- Microscopy & Microanalysis, 2005, v. 11, n. 5, p. 456, doi. 10.1017/s1431927605050373
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Recent Advances in Electron Tomography: TEM and HAADF-STEM Tomography for Materials Science and Semiconductor Applications.
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- Microscopy & Microanalysis, 2005, v. 11, n. 5, p. 378, doi. 10.1017/s1431927605050361
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High-Resolution Analytical TEM and Energy-Filtered Imaging of CoPt-Oxide Perpendicular Magnetic Recording Media.
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- Microscopy & Microanalysis, 2005, v. 11, p. 1806, doi. 10.1017/S1431927605502186
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Transmission Electron Microscopy Study of FeHfN Thin Films for Magnetic Properties Optimization and Integration Above Silicon Circuits.
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- Microscopy & Microanalysis, 2005, v. 11, p. 1804, doi. 10.1017/S1431927605501922
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In-situ Lorentz TEM Observations in Ferromagnetic Shape Memory Alloys.
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- Microscopy & Microanalysis, 2005, v. 11, p. 1802, doi. 10.1017/S1431927605501260
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Imaging and Characterization of the Microstructure and a Deformation Mechanism of Commercial Nickel Based Superalloys γ' in a Nickel-Based Superalloy using Energy Filtered Transmission Electron Microscopy.
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- Microscopy & Microanalysis, 2005, v. 11, p. 1800, doi. 10.1017/S1431927605509267
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An Interfacial Study of Borosilicate Glass and Fe-Ni-Co Alloy Joint.
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- Microscopy & Microanalysis, 2005, v. 11, p. 1798, doi. 10.1017/S1431927605504926
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Shifting Through Phase Fields: CaAl<sub>4</sub>O<sub>7</sub> on Sapphire.
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- Microscopy & Microanalysis, 2005, v. 11, p. 1796, doi. 10.1017/S1431927605504495
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Flattening of the Si-SiO<sub>2</sub> Interface in Ultra-Thin SIMOX Structures.
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- Microscopy & Microanalysis, 2005, v. 11, p. 1794, doi. 10.1017/S1431927605502897
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Control of Grain Boundaries in Orthorhombic Alpha-Uranium.
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- Microscopy & Microanalysis, 2005, v. 11, p. 1792, doi. 10.1017/S1431927605506640
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Kinetics of Agglomeration of Gibbsite Al(OH)<sub>3</sub> Crystals in the Precipitation Stage of the Bayer Process.
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- Microscopy & Microanalysis, 2005, v. 11, p. 1790, doi. 10.1017/S1431927605507050
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ADF-STEM imaging of c-Si/a-Si interfaces.
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- Microscopy & Microanalysis, 2005, v. 11, p. 1788, doi. 10.1017/S1431927605503957
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Microstructures of a Highly Conductive Nb:SrTiO<sub>3</sub> Thin Film.
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- Microscopy & Microanalysis, 2005, v. 11, p. 1786, doi. 10.1017/S1431927605500655
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Determination of strain relaxation at the free surface of strained-SiGe film using Convergent Beam Electron Diffraction.
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- Microscopy & Microanalysis, 2005, v. 11, p. 1784, doi. 10.1017/S1431927605505208
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Microstructural Studies of a Directionally Solidified Nb-27Mo-27Cr-9Al-9Si Alloy.
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- Microscopy & Microanalysis, 2005, v. 11, p. 1782, doi. 10.1017/S1431927605507189
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EBSD Analysis of Solid-State Reactions Between Al<sub>2</sub>O<sub>3</sub> and Cu<sub>2</sub>O.
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- Microscopy & Microanalysis, 2005, v. 11, p. 1780, doi. 10.1017/S1431927605509097
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3d Reconstruction of Natural Soil Aggregates From the Tropics.
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- Microscopy & Microanalysis, 2005, v. 11, p. 1778, doi. 10.1017/S1431927605507736
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A Microscopy Study on the Origin of Asterism in Almandine-Pyrope Garnets.
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- Microscopy & Microanalysis, 2005, v. 11, p. 1776, doi. 10.1017/S1431927605502150
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Characterization of Epitaxial Bands and Electron Beam Damage in Natural Zircon Using Cathodoluminescence.
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- Microscopy & Microanalysis, 2005, v. 11, p. 1774, doi. 10.1017/S143192760550312X
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SEM Evidence of Acidithiobacillus ferrooxidans (Af) Attachment to Sulfide Refractory Ore Surface.
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- Microscopy & Microanalysis, 2005, v. 11, p. 1772, doi. 10.1017/S1431927605506342
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Observation of the Structure of Iridescent Surface Layer on Chalcopyrite.
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- Microscopy & Microanalysis, 2005, v. 11, p. 1770, doi. 10.1017/S1431927605505014
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Application of Scanning Electron Microscopy to Characterization of Radioactive Solid Wastes from Underground Storage Tanks.
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- Microscopy & Microanalysis, 2005, v. 11, p. 1768, doi. 10.1017/S1431927605504069
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Valence Determination by Electron Energy Loss Spectroscopy of the Multi-Valence Metal Chromium.
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- Microscopy & Microanalysis, 2005, v. 11, p. 1766, doi. 10.1017/S1431927605502332
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Use of Transmission Electron Microscopy in Combinatorial Studies of Functional Oxides.
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- Microscopy & Microanalysis, 2005, v. 11, p. 1764, doi. 10.1017/S1431927605503659
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Relationship between microstructure, stress and hardness in multilayer coatings.
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- Microscopy & Microanalysis, 2005, v. 11, p. 1762, doi. 10.1017/S1431927605508614
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Microstructure and Strain Relaxation of Single-crystal Gadolinium-doped Ceria Thin Films on LaAlO<sub>3</sub> Substrates.
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- Microscopy & Microanalysis, 2005, v. 11, p. 1760, doi. 10.1017/S1431927605507414
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Crack Characterization Using Image Analysis.
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- Microscopy & Microanalysis, 2005, v. 11, p. 1758, doi. 10.1017/S1431927605505440
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Effects of Deposition Conditions on Hydrous Ruthenium Oxides Coatings on Ti Substrate for Supercapacitors by Cathodic Deposition Method.
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- Microscopy & Microanalysis, 2005, v. 11, p. 1756, doi. 10.1017/S1431927605503064
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