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- Title
Surface potential measurement on organic ultrathin film by Kelvin probe force microscopy using a piezoelectric cantilever.
- Authors
Kobayashi, K.; Yamada, H.; Umeda, K.; Horiuchi, T.; Watanabe, S.; Fujii, T.; Hotta, S.; Matsushige, K.
- Abstract
We measured surface potential (SP) on a π-conju-gated thiophene oligomer monolayer film deposited on a metallic substrate by Kelvin probe force microscopy using a piezoelectric cantilever. Since the cantilever has a relatively large spring constant (calculated as about 150 N/m), the frequency modulation detection method was used for tip-sample distance regulation in order to achieve high-sensitivity SP measurement. A contact potential difference between monolayer regions and the metallic substrate was clearly observed in an SP image. Furthermore, an apparent change in a contrast of the SP image was observed while the sample was irradiated with ultraviolet light.
- Subjects
MEASUREMENT of surfact potential; THIN films; KELVIN probe force microscopy; PIEZOELECTRIC devices; CANTILEVERS; OLIGOMERS
- Publication
Applied Physics A: Materials Science & Processing, 2001, Vol 72, pS97
- ISSN
0947-8396
- Publication type
Article
- DOI
10.1007/s003390100641