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- Title
Resistance to Colletotrichum lindemuthianum in Phaseolus vulgaris: a case study for mapping two independent genes.
- Authors
Geffroy, Valérie; Sévignac, Mireille; Billant, Paul; Dron, Michel; Langin, Thierry
- Abstract
Anthracnose, caused by the hemibiotrophic fungal pathogen Colletotrichum lindemuthianum is a devastating disease of common bean. Resistant cultivars are economical means for defense against this pathogen. In the present study, we mapped resistance specificities against 7 C. lindemuthianum strains of various geographical origins revealing differential reactions on BAT93 and JaloEEP558, two parents of a recombinant inbred lines (RILs) population, of Meso-american and Andean origin, respectively. Six strains revealed the segregation of two independent resistance genes. A specific numerical code calculating the LOD score in the case of two independent segregating genes (i.e. genes with duplicate effects) in a RILs population was developed in order to provide a recombination value ( r) between each of the two resistance genes and the tested marker. We mapped two closely linked Andean resistance genes ( Co-x, Co-w) at the end of linkage group (LG) B1 and mapped one Meso-american resistance genes ( Co-u) at the end of LG B2. We also confirmed the complexity of the previously identified B4 resistance gene cluster, because four of the seven tested strains revealed a resistance specificity near Co-y from JaloEEP558 and two strains identified a resistance specificity near Co-9 from BAT93. Resistance genes found within the same cluster confer resistance to different strains of a single pathogen such as the two anthracnose specificities Co-x and Co-w clustered at the end of LG B1. Clustering of resistance specificities to multiple pathogens such as fungi ( Co-u) and viruses ( I) was also observed at the end of LG B2.
- Subjects
COLLETOTRICHUM lindemuthianum; COMMON bean; GENE mapping; ANTHRACNOSE; PATHOGENIC microorganisms
- Publication
Theoretical & Applied Genetics, 2008, Vol 116, Issue 3, p407
- ISSN
0040-5752
- Publication type
Article
- DOI
10.1007/s00122-007-0678-y