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- Title
Imaging grain boundaries in a two-dimensional polymer.
- Authors
Richards, Victoria
- Abstract
Organic materials are highly sensitive to electron beam irradiation and thus easily damaged upon imaging by electron microscopy. Now, low-dose aberration-corrected high resolution transmission electron microscopy allows for less invasive near-atomic-scale imaging of a two-dimensional polymer.
- Subjects
CRYSTAL grain boundaries; ELECTRON beams; IRRADIATION; TRANSMISSION electron microscopy; OPTICAL aberrations
- Publication
Communications Chemistry, 2020, Vol 3, Issue 1, pN.PAG
- ISSN
2399-3669
- Publication type
Article
- DOI
10.1038/s42004-020-00380-3