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- Title
Determination of critical island size in para-sexiphenyl islands on SiO2 using capture-zone scaling.
- Authors
Lorbek, S.; Hlawacek, G.; Teichert, C.
- Abstract
One of the important parameters in understanding the mechanism of the early stage of organic thin-film growth is the critical nucleus size i*. Here, submonolayer films of para-sexiphenyl grown on amorphous silicon dioxide substrates were investigated by means of atomic-force microscopy and have been analyzed using the recently proposed capture-zone scaling. Applying the generalized Wigner surmise we determine from the capture-zone distribution i* at room temperature and 373 K. The results are compared to traditional analysis by island-size scaling and the applicability of the capture-zone scaling is critically discussed with respect to island shape.
- Subjects
ORGANIC thin films; SILICA; ATOMIC force microscopy; WIGNER distribution; SUBSTRATES (Materials science); PHYSICS
- Publication
European Physical Journal - Applied Physics, 2011, Vol 55, Issue 2, pN.PAG
- ISSN
1286-0042
- Publication type
Article
- DOI
10.1051/epjap/2011100428